Loading test_purposes/Diameter_Common.tplan2 +23 −9 Original line number Diff line number Diff line Loading @@ -78,20 +78,34 @@ Test Configuration CF_VxLTE_INT containing Tester component EPC_PGW_A of type DiameterComp Tester component EPC_PCRF_A of type DiameterComp SUT component IMS_A of type DiameterComp SUT component EPC_PGW_A of type DiameterComp SUT component EPC_PCRF_A of type DiameterComp SUT component S_CSCF_A of type DiameterComp SUT component I_CSCF_A of type DiameterComp SUT component P_CSCF_A of type DiameterComp SUT component HSS_A of type DiameterComp SUT component EPC_MME_A of type DiameterComp SUT component IMS_AS_A of type DiameterComp connection between EPC_MME_A.g and HSS_A.g connection between EPC_PGW_A.g and EPC_PCRF_A.g connection between EPC_PCRF_A.g and P_CSCF_A.g connection between HSS_A.g and S_CSCF_A.g connection between HSS_A.g and I_CSCF_A.g connection between IMS_AS_A.g and HSS_A.g ; Test Configuration CF_VxLTE_RMI containing Tester component EPC_PCRF_A of type DiameterComp Tester component EPC_PCRF_B of type DiameterComp SUT component IMS_A of type DiameterComp connection between EPC_PCRF_A.g and EPC_PCRF_A.g SUT component EPC_PGW_B of type DiameterComp SUT component EPC_PCRF_A of type DiameterComp SUT component EPC_PCRF_B of type DiameterComp SUT component P_CSCF_B of type DiameterComp SUT component HSS_A of type DiameterComp SUT component EPC_MME_B of type DiameterComp connection between EPC_MME_B.g and HSS_A.g connection between EPC_PGW_B.g and EPC_PCRF_B.g connection between EPC_PCRF_A.g and EPC_PCRF_B.g connection between EPC_PCRF_B.g and P_CSCF_B.g ; } // End of Configuration section Loading test_purposes/Sip_Common.tplan2 +59 −45 Original line number Diff line number Diff line Loading @@ -152,64 +152,78 @@ Package Sip_Common { Component Type EnumDBComponent with gate gEnum of type enumGT; Test Configuration CF_VxLTE_INT containing SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_A of type SipComponent SUT component IMS_S_CSCF_A of type SipComponent SUT component IMS_I_CSCF_A of type SipComponent SUT component IMS_AS_A of type SipComponent SUT component IMS_IBCF_A of type SipComponent SUT component IMS_IBCF_B of type SipComponent connection between UE_A.g and IMS_P_CSCF_A.g connection between IMS_P_CSCF_A.g and IMS_S_CSCF_A.g connection between IMS_S_CSCF_A.g and IMS_I_CSCF_A.g connection between IMS_I_CSCF_A.g and IMS_IBCF_A.g connection between IMS_IBCF_A.g and IMS_IBCF_B.g connection between IMS_S_CSCF_A.g and IMS_AS_A.g ; Test Configuration CF_VxLTE_RMI Test Configuration CF_VxLTE_RMI_A ; Test Configuration CF_VxLTE_RMI_B ; Test Configuration CF_VxLTE_RMI_S8HR ; Test Configuration CFG_IC_01 containing Tester component UE_A of type SipComponent Tester component NW_UE_B of type SipComponent SUT component IMS_A of type SipComponent connection between UE_A.g and IMS_A.g connection between IMS_A.g and NW_UE_B.g SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_B of type SipComponent SUT component IMS_S_CSCF_B of type SipComponent SUT component IMS_AS_B of type SipComponent SUT component IMS_IBCF_B of type SipComponent SUT component IMS_IBCF_A of type SipComponent connection between UE_A.g and IMS_P_CSCF_B.g connection between IMS_P_CSCF_B.g and IMS_S_CSCF_B.g connection between IMS_S_CSCF_B.g and IMS_I_CSCF_B.g connection between IMS_I_CSCF_B.g and IMS_IBCF_B.g connection between IMS_IBCF_B.g and IMS_IBCF_A.g ; Test Configuration CFG_IC_02 Test Configuration CF_VxLTE_RMI_A containing Tester component UE_A of type SipComponent Tester component UE_B of type SipComponent Tester component NW_UE_B of type SipEnumComponent Tester component Enum_DB of type EnumDBComponent SUT component IMS_A of type SipEnumComponent connection between UE_A.g and IMS_A.gSip connection between IMS_A.gEnum and Enum_DB.gEnum connection between NW_UE_B.gEnum and Enum_DB.gEnum connection between IMS_A.gSip and NW_UE_B.gSip connection between NW_UE_B.gSip and UE_B.g SUT component UE_B of type SipComponent SUT component IMS_P_CSCF_A of type SipComponent SUT component IMS_S_CSCF_A of type SipComponent SUT component IMS_IBCF_A of type SipComponent SUT component IMS_IBCF_B of type SipComponent connection between UE_B.g and IMS_P_CSCF_A.g connection between IMS_P_CSCF_A.g and IMS_S_CSCF_A.g connection between IMS_S_CSCF_A.g and IMS_IBCF_A.g connection between IMS_IBCF_A.g and IMS_IBCF_B.g ; Test Configuration CFG_IC_03 Test Configuration CF_VxLTE_RMI_B containing Tester component UE_A of type SipComponent Tester component UE_B of type SipComponent Tester component IMS_B of type SipComponent SUT component IMS_A of type SipComponent connection between UE_A.g and IMS_A.g connection between UE_B.g and IMS_A.g connection between IMS_A.g and IMS_B.g SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_B of type SipComponent SUT component IMS_S_CSCF_B of type SipComponent SUT component IMS_AS_B of type SipComponent SUT component IMS_IBCF_B of type SipComponent SUT component IMS_IBCF_A of type SipComponent connection between UE_A.g and IMS_P_CSCF_B.g connection between IMS_P_CSCF_B.g and IMS_S_CSCF_B.g connection between IMS_S_CSCF_B.g and IMS_I_CSCF_B.g connection between IMS_I_CSCF_B.g and IMS_IBCF_B.g connection between IMS_IBCF_B.g and IMS_IBCF_A.g ; Test Configuration CFG_xxx_02 Test Configuration CF_VxLTE_RMI_S8HR containing Tester component UE_A of type SipComponent Tester component IMS_PCRF_A of type SipComponent SUT component IUT of type SipComponent connection between UE_A.g and IMS_PCRF_A.g connection between IMS_PCRF_A.g and IMS_xxx_A.g SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_A of type SipComponent SUT component IMS_S_CSCF_A of type SipComponent SUT component IMS_I_CSCF_A of type SipComponent SUT component IMS_IBCF_A of type SipComponent SUT component IMS_IBCF_B of type SipComponent connection between UE_A.g and IMS_P_CSCF_A.g connection between IMS_P_CSCF_A.g and IMS_S_CSCF_A.g connection between IMS_S_CSCF_A.g and IMS_I_CSCF_A.g connection between IMS_I_CSCF_A.g and IMS_IBCF_A.g connection between IMS_IBCF_A.g and IMS_IBCF_B.g ; } // End of Configuration section Loading Loading
test_purposes/Diameter_Common.tplan2 +23 −9 Original line number Diff line number Diff line Loading @@ -78,20 +78,34 @@ Test Configuration CF_VxLTE_INT containing Tester component EPC_PGW_A of type DiameterComp Tester component EPC_PCRF_A of type DiameterComp SUT component IMS_A of type DiameterComp SUT component EPC_PGW_A of type DiameterComp SUT component EPC_PCRF_A of type DiameterComp SUT component S_CSCF_A of type DiameterComp SUT component I_CSCF_A of type DiameterComp SUT component P_CSCF_A of type DiameterComp SUT component HSS_A of type DiameterComp SUT component EPC_MME_A of type DiameterComp SUT component IMS_AS_A of type DiameterComp connection between EPC_MME_A.g and HSS_A.g connection between EPC_PGW_A.g and EPC_PCRF_A.g connection between EPC_PCRF_A.g and P_CSCF_A.g connection between HSS_A.g and S_CSCF_A.g connection between HSS_A.g and I_CSCF_A.g connection between IMS_AS_A.g and HSS_A.g ; Test Configuration CF_VxLTE_RMI containing Tester component EPC_PCRF_A of type DiameterComp Tester component EPC_PCRF_B of type DiameterComp SUT component IMS_A of type DiameterComp connection between EPC_PCRF_A.g and EPC_PCRF_A.g SUT component EPC_PGW_B of type DiameterComp SUT component EPC_PCRF_A of type DiameterComp SUT component EPC_PCRF_B of type DiameterComp SUT component P_CSCF_B of type DiameterComp SUT component HSS_A of type DiameterComp SUT component EPC_MME_B of type DiameterComp connection between EPC_MME_B.g and HSS_A.g connection between EPC_PGW_B.g and EPC_PCRF_B.g connection between EPC_PCRF_A.g and EPC_PCRF_B.g connection between EPC_PCRF_B.g and P_CSCF_B.g ; } // End of Configuration section Loading
test_purposes/Sip_Common.tplan2 +59 −45 Original line number Diff line number Diff line Loading @@ -152,64 +152,78 @@ Package Sip_Common { Component Type EnumDBComponent with gate gEnum of type enumGT; Test Configuration CF_VxLTE_INT containing SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_A of type SipComponent SUT component IMS_S_CSCF_A of type SipComponent SUT component IMS_I_CSCF_A of type SipComponent SUT component IMS_AS_A of type SipComponent SUT component IMS_IBCF_A of type SipComponent SUT component IMS_IBCF_B of type SipComponent connection between UE_A.g and IMS_P_CSCF_A.g connection between IMS_P_CSCF_A.g and IMS_S_CSCF_A.g connection between IMS_S_CSCF_A.g and IMS_I_CSCF_A.g connection between IMS_I_CSCF_A.g and IMS_IBCF_A.g connection between IMS_IBCF_A.g and IMS_IBCF_B.g connection between IMS_S_CSCF_A.g and IMS_AS_A.g ; Test Configuration CF_VxLTE_RMI Test Configuration CF_VxLTE_RMI_A ; Test Configuration CF_VxLTE_RMI_B ; Test Configuration CF_VxLTE_RMI_S8HR ; Test Configuration CFG_IC_01 containing Tester component UE_A of type SipComponent Tester component NW_UE_B of type SipComponent SUT component IMS_A of type SipComponent connection between UE_A.g and IMS_A.g connection between IMS_A.g and NW_UE_B.g SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_B of type SipComponent SUT component IMS_S_CSCF_B of type SipComponent SUT component IMS_AS_B of type SipComponent SUT component IMS_IBCF_B of type SipComponent SUT component IMS_IBCF_A of type SipComponent connection between UE_A.g and IMS_P_CSCF_B.g connection between IMS_P_CSCF_B.g and IMS_S_CSCF_B.g connection between IMS_S_CSCF_B.g and IMS_I_CSCF_B.g connection between IMS_I_CSCF_B.g and IMS_IBCF_B.g connection between IMS_IBCF_B.g and IMS_IBCF_A.g ; Test Configuration CFG_IC_02 Test Configuration CF_VxLTE_RMI_A containing Tester component UE_A of type SipComponent Tester component UE_B of type SipComponent Tester component NW_UE_B of type SipEnumComponent Tester component Enum_DB of type EnumDBComponent SUT component IMS_A of type SipEnumComponent connection between UE_A.g and IMS_A.gSip connection between IMS_A.gEnum and Enum_DB.gEnum connection between NW_UE_B.gEnum and Enum_DB.gEnum connection between IMS_A.gSip and NW_UE_B.gSip connection between NW_UE_B.gSip and UE_B.g SUT component UE_B of type SipComponent SUT component IMS_P_CSCF_A of type SipComponent SUT component IMS_S_CSCF_A of type SipComponent SUT component IMS_IBCF_A of type SipComponent SUT component IMS_IBCF_B of type SipComponent connection between UE_B.g and IMS_P_CSCF_A.g connection between IMS_P_CSCF_A.g and IMS_S_CSCF_A.g connection between IMS_S_CSCF_A.g and IMS_IBCF_A.g connection between IMS_IBCF_A.g and IMS_IBCF_B.g ; Test Configuration CFG_IC_03 Test Configuration CF_VxLTE_RMI_B containing Tester component UE_A of type SipComponent Tester component UE_B of type SipComponent Tester component IMS_B of type SipComponent SUT component IMS_A of type SipComponent connection between UE_A.g and IMS_A.g connection between UE_B.g and IMS_A.g connection between IMS_A.g and IMS_B.g SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_B of type SipComponent SUT component IMS_S_CSCF_B of type SipComponent SUT component IMS_AS_B of type SipComponent SUT component IMS_IBCF_B of type SipComponent SUT component IMS_IBCF_A of type SipComponent connection between UE_A.g and IMS_P_CSCF_B.g connection between IMS_P_CSCF_B.g and IMS_S_CSCF_B.g connection between IMS_S_CSCF_B.g and IMS_I_CSCF_B.g connection between IMS_I_CSCF_B.g and IMS_IBCF_B.g connection between IMS_IBCF_B.g and IMS_IBCF_A.g ; Test Configuration CFG_xxx_02 Test Configuration CF_VxLTE_RMI_S8HR containing Tester component UE_A of type SipComponent Tester component IMS_PCRF_A of type SipComponent SUT component IUT of type SipComponent connection between UE_A.g and IMS_PCRF_A.g connection between IMS_PCRF_A.g and IMS_xxx_A.g SUT component UE_A of type SipComponent SUT component IMS_P_CSCF_A of type SipComponent SUT component IMS_S_CSCF_A of type SipComponent SUT component IMS_I_CSCF_A of type SipComponent SUT component IMS_IBCF_A of type SipComponent SUT component IMS_IBCF_B of type SipComponent connection between UE_A.g and IMS_P_CSCF_A.g connection between IMS_P_CSCF_A.g and IMS_S_CSCF_A.g connection between IMS_S_CSCF_A.g and IMS_I_CSCF_A.g connection between IMS_I_CSCF_A.g and IMS_IBCF_A.g connection between IMS_IBCF_A.g and IMS_IBCF_B.g ; } // End of Configuration section Loading