Loading test_purposes/esrp.tplan2 +175 −179 Original line number Diff line number Diff line Loading @@ -46,22 +46,18 @@ Package NG112_ESRP { // LOCATION_1: "12.00, 53.00" // } // Data { // type PDU; // } // Configuration { // Interface Type defaultGT accepts PDU; // Component Type NG112Comp with gate g of type defaultGT; // Test Configuration CFG_ESRP_01 // containing // Tester component BCF of type NG112Comp // Tester component LIS of type NG112Comp // Tester component ECRF of type NG112Comp // SUT component IUT of type NG112Comp // connection between BCF.g and IUT.g // connection between LIS.g and IUT.g // connection between ECRF.g and IUT.g; // } Data { type PDU; } Configuration { Interface Type defaultGT accepts PDU; Component Type NG112Comp with gate g of type defaultGT; Test Configuration CFG_ESRP_01 containing Tester component ESRPF of type NG112Comp SUT component IUT of type NG112Comp connection between ESRP.g and IUT.g; } Test Purpose { TP Id TP_ESRP_SIP_INVITE_BV_01 Loading @@ -70,7 +66,7 @@ Test objective Reference "Next Generation 112 Long Term Definition http://www.eena.org/uploads/gallery/files/pdf/2013-03-15-eena_ng_longtermdefinitionupdated.pdf Clause 4.3", "https://tools.ietf.org/html/rfc5222" //Config Id CFG_ESRP_01 Config Id CFG_ESRP_01 PICS Selection PICS_SERVICE_ESRP Initial conditions with { the IUT entity isConfiguredWith the ECRF Loading Loading @@ -145,7 +141,7 @@ Test objective Reference "Next Generation 112 Long Term Definition http://www.eena.org/uploads/gallery/files/pdf/2013-03-15-eena_ng_longtermdefinitionupdated.pdf Clause 4.3", "https://tools.ietf.org/html/rfc5222" //Config Id CFG_ESRP_01 Config Id CFG_ESRP_01 PICS Selection PICS_SERVICE_ESRP Initial conditions with { the IUT entity isConfiguredWith the ECRF Loading Loading
test_purposes/esrp.tplan2 +175 −179 Original line number Diff line number Diff line Loading @@ -46,22 +46,18 @@ Package NG112_ESRP { // LOCATION_1: "12.00, 53.00" // } // Data { // type PDU; // } // Configuration { // Interface Type defaultGT accepts PDU; // Component Type NG112Comp with gate g of type defaultGT; // Test Configuration CFG_ESRP_01 // containing // Tester component BCF of type NG112Comp // Tester component LIS of type NG112Comp // Tester component ECRF of type NG112Comp // SUT component IUT of type NG112Comp // connection between BCF.g and IUT.g // connection between LIS.g and IUT.g // connection between ECRF.g and IUT.g; // } Data { type PDU; } Configuration { Interface Type defaultGT accepts PDU; Component Type NG112Comp with gate g of type defaultGT; Test Configuration CFG_ESRP_01 containing Tester component ESRPF of type NG112Comp SUT component IUT of type NG112Comp connection between ESRP.g and IUT.g; } Test Purpose { TP Id TP_ESRP_SIP_INVITE_BV_01 Loading @@ -70,7 +66,7 @@ Test objective Reference "Next Generation 112 Long Term Definition http://www.eena.org/uploads/gallery/files/pdf/2013-03-15-eena_ng_longtermdefinitionupdated.pdf Clause 4.3", "https://tools.ietf.org/html/rfc5222" //Config Id CFG_ESRP_01 Config Id CFG_ESRP_01 PICS Selection PICS_SERVICE_ESRP Initial conditions with { the IUT entity isConfiguredWith the ECRF Loading Loading @@ -145,7 +141,7 @@ Test objective Reference "Next Generation 112 Long Term Definition http://www.eena.org/uploads/gallery/files/pdf/2013-03-15-eena_ng_longtermdefinitionupdated.pdf Clause 4.3", "https://tools.ietf.org/html/rfc5222" //Config Id CFG_ESRP_01 Config Id CFG_ESRP_01 PICS Selection PICS_SERVICE_ESRP Initial conditions with { the IUT entity isConfiguredWith the ECRF Loading